Nanometrics NanoSpec 8300X Film Thickness Analyzer Wafer

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Used Nanometrics NanoSpec 8300X Film Thickness Analyzer Wafer
NanoSpec 8300X Film Thickness Analyzer, Wafer Condition: For parts or not working Contents: N...

2007 Nanometrics Vertex Photoluminescence Measuring Device

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Used 2007 Nanometrics Vertex Photoluminescence Measuring Device
- Gratings: 150g-1250 300g-762 600g-400 - Detectors: CCD (512 pixels) InGaAs (256) pixels - Laser...

2012 Nanometrics UNIFIRE 7900-L

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Used 2012 Nanometrics UNIFIRE 7900-L
Tool Status Connected Wafer Size 300 mm Fab Section Metrology Asset Description ICD2900-T ICD2...

NANOMETRICS Nano 8000X

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Used NANOMETRICS  Nano 8000X
As is 6" The tool is now configured for 8’’wafer for most of Ox films and photo resister film. ...

Nanometrics Nanospec AFT2100 Film Thickness Measurement System

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Used Nanometrics Nanospec AFT2100 Film Thickness Measurement System
film thickness from 100A to 50 microns Upgraded to new Olympus MS Plan infinity corrected 5x/10x...

Nanometrics EFEM module

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Used Nanometrics EFEM module
Nanometrics EFM with Brooks robot Note: Three unit load port not included....Already sold.

2003 Nanometrics 9100

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Used 2003 Nanometrics 9100
This tool missing parts:Main Computer missing. The other no missing.

Nanometrics NanoSpec AFT 200 Thickness Measurement System

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Used Nanometrics  NanoSpec AFT 200 Thickness Measurement System
Nanometrics NanoSpec AFT 200 Thickness Measurement System

Nanometrics Nanospec/AFT M6100

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Used Nanometrics Nanospec/AFT M6100
8" Configuration overview: Nanospec/AFT M6099 Filk thick Tool status: offline, broken

Nanometrics 9010 Lithos

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Used Nanometrics 9010 Lithos
Wafer size: 300mm Semiconductor Fabrication Metrology Equipment CD Measurement System