2012 HITACHI SU-8040

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Used 2012 HITACHI SU-8040
Secondary electron image resolution: 1.0nm (15kV, WD=4mm) 1.3nm (1kV, WD=1.5mm, Deceleration mo...

Hitachi HD-2300

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Used Hitachi HD-2300
Process Type: FA SEMs/TEMs/Dual Beams Wafer Size: N/A Status of Equipment: Warehouse 200kV ded...

Hitachi S-5500

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Refurbished Hitachi S-5500
Process Type: FA SEMs/TEMs/Dual Beams Specifications: Secondary Electron image resolution: 0.4...

2008 Hitachi SU-70

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Refurbished 2008 Hitachi SU-70
Process Type: FA SEMs/TEMs/Dual Beams Wafer Size: N//A Date of Manufacture: 2008 Equipment Inf...

Hitachi S-4700-II

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Refurbished Hitachi S-4700-II
Process Type: FA SEMs/TEMs/Dual Beams Wafer Size: N/A Status of Equipment: Refurbished Configu...

Hitachi S-4700-I w/EDX

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Used Hitachi S-4700-I
Status of Equipment: Crated Specification: Secondary electron image resolution: 2.1nm at 1kV 1...

Hitachi S-4800-II

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Refurbished Hitachi S-4800-II
Vintage: 2004/2007 Process Type: FA SEMs/TEMs/Dual Beams Status of Equipment: Refurbished Spec...

2015 Hitachi Brightfield-Darkfield STEM detectors from Hitachi Regulus SU-8XXX

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Used 2015 Hitachi Brightfield-Darkfield STEM detectors from Hitachi Regulus SU-8XXX
Process Type: FA SEMs/TEMs/Dual Beams Date of Manufacture: 2015 Status of Equipment: De-install...

Hitachi S-7840

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Refurbished Hitachi  S-7840
Process Type: Metrology & Inspection Date of Manufacture: 2001 Refurbished Hitachi S-7840 conf...

1997 Hitachi S-7800

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Used 1997 Hitachi  S-7800
Process Type: Metrology & Inspection Wafer Size: 200mm Date of Manufacture: Aug 1997 Status of...

1996 HITACHI S-3200 SEM with Oxford INCAx-act Detector

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Used HITACHI S-3200 SEM
Complete S-3200N SEM with Oxford INCAx-act Detector Oxford INCAx-act Detector Vintage 2009 Res...

HITACHI S8840 CDSEM

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Used HITACHI S8840 CDSEM