1994 Nanometrics 4000

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Used 1994 Nanometrics  4000
Nanometrics 4000 Film Thickness Measurement System Model Number 7200-1821 Rev B 150 mm Wafer Co...

2011 RUDOLPH MetaPulse-III 300XCu

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Used 2011 RUDOLPH   MetaPulse-III 300XCu
2011 RUDOLPH MetaPulse-III 300XCu Metal Thickness WAFER SIZE: 12

1996 RUDOLPH FE-VII

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Used 1996 RUDOLPH  FE-VII
1996 RUDOLPH FE-VII Film Thickness WAFER SIZE: 8

2003 Leica INS 3300 DUV

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Refurbished 2003 Leica  INS 3300 DUV
Leica INS3300 is the most advanced solution in the production control of 200 mm and 300 mm wafers...

KLA TENCOR Alpha Step 500 Surface Profiler

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Used KLA TENCOR Alpha Step 500 Surface Profiler
KLA Tencor Alpha-Step 500 Surface Profiler Selling as is, No PC or Software included Located in o...

Nikon Optistation VII 300mm Wafer inspection System

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Used Nikon Optistation VII 300mm Wafer inspection System
Nikon Optistation VII 300mm Wafer inspection System 2 Sets of Nikon Optistation VII complete and ...

RECIF SPP8 Wafer Transfer 200mm

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Used RECIF SPP8 Wafer Transfer 200mm
RECIF SPP8 Wafer Transfer for 200mm Wafers Mfg Date: 1996 Tabletop Vacuum Free Horizontal Tran...

Dektak 3030

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Used Dektak 3030
Dektak 3030 Sold in working condition. See demo video's attached

HIAC Model 5120 Particle Counter

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Used HIAC Model 5120 Particle Counter
HIAC Model 5120 Particle Counter - 16 channels - it has never been used

Shimadzu DUH 202 Ultra Micro Hardness Tester

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Used Shimadzu DUH 202 Ultra Micro Hardness Tester
Shimadzu DUH 202 Ultra Micro Hardness Tester

ASM Dragon 2300

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Used ASM Dragon 2300
PECVD Equipment for Barrier RC1: SiCx, RC2:Aurora2.7 Wafer Size 12 Inch

Hitachi S-4700 Field Emission Scanning Electron Microscope

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Used Hitachi S-4700 Field Emission Scanning Electron Microscope
CONFIGURATION SHEET Hitachi S-4700 Field Emition Scanning Electron Microscope Selling as is where...