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2010 TEL Tactrus NCCP
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TEL, Tactrus NCCP, 300mm, Etch Connected in fab with 2 chms.
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2006 Solvision PRECIS 3D
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Tool Status Disconnected Wafer Size 300 mm Fab Section Metrology Asset Description Wafer Inspe...
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2016 Oxford Instruments Opal
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Tool Status Connected Wafer Size NA Fab Section Lab Asset Description RF/Plasma oxide depositi...
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2001 KEITHLEY S475
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KEITHLEY, S425, Kerf Parametric Tester
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1996 AMAT P5000
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Wafer size: 200mm Fab section: thin film Asset description: precision 5000 CVD system Software...
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2001 KEITHLEY S425
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KEITHLEY, S425, Kerf Parametric Tester Tool ID: K259
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1993 LAM TCP9408SE
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Description Poly Etch non WAC Wafer Size 200 mm Fab Section Etch Asset Description LAM TCP 940...
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2001 KEITHLEY S475
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KEITHLEY, S475, Kerf Parametric Tester, Tool ID: K270
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2001 KEITHLEY S425
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KEITHLEY, S425, Kerf Parametric Tester Tool ID: K611X
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2012 Nexx Systems Apollo HP
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Tool Status Running Wafers Wafer Size 300 mm Fab Section R&D Asset Description TEL NEXX APOLLO...
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Keithley S425
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Keithley, S425, Kerf Parametric Tester
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Leica INS 3000
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The missing parts are - eyepiece Lens Assy 1ea - Lamp housing 1ea of three is missing
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