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2011 Camtek H.K. Limited EM3I
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AIM 2 Vintage: 2011
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HIMS NMI-100
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Defect inspection
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Philips Electron Optics B.V. PHI-680
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AES
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Bruker Quantax200
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EDS
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2009 JEOL JSM-7500F
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SEM Vintage: 2009
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2006 Hitachi HD2300
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STEM Vintage: 2006
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2007 Hitachi IS3000
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Dark field Vintage: 2007
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2005 KLA FIT3120
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Particle counter Vintage: 2005
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2006 Rudolph WV320
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Macro inspection Vintage: 2006
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2006 Siemens Technology 3 DEMESION MEA
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Fab- Metrology Vintage: 2006
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2001 ADE NANOMAPPER
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SQM Vintage: 2001
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2005 Hitachi I6300
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E-BEAM Vintage: 2005
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