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AIT CMT-SR2000N WITH OPTION
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AIT CMT-SR2000N WITH OPTION Process: analysis
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AIT CMT-SR2000N
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AIT CMT-SR2000N Process: analysis
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2006 Hitachi S-9260 CD-SEM
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as-is Wafer Size: 200mm
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2014 LTX Credence ASLx
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- Full checkers - Vintage 2014 - Located in US - All as shown in the pictures
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Rudolph FE-VIID Ellipsometer
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Hewlett Packard 4194A Impedance Gain-Phase Analyzer
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Hewlett Packard 4194A Impedance Gain-Phase Analyzer Fully refurbished and calibrated See PDF be...
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Zeiss Axiotron
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Zeiss Axiotron Microscope 200 mm Wafer Configuration 10X Eyepieces 5X, 10X, 20X, 50X, 100X Obj...
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Waferworx 53-450000-001
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Waferworx 53-450000-001 3D Inspection 200mm and has Olympus Mdl MX80-F Microscope WAFER SIZE: 200mm
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KLA TENCOR PROMETRIX AIT II
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KLA TENCOR PROMETRIX AIT II Metrology WAFER SIZE: 200MM
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Hitachi
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2001 Hitachi WA200
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Hitachi WA200 FAB SMIFF interface Wide area scanning probe microscope WAFER SIZE: 8"
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KLA-Tencor Spectra-Shape 8660
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KLA-Tencor Spectra-Shape 8660 Semiconductor Fabrication Metrology Equipment CD Measurement System WAFER S...
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