AIT CMT-SR2000N WITH OPTION

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Used AIT CMT-SR2000N WITH OPTION
AIT CMT-SR2000N WITH OPTION Process: analysis

AIT CMT-SR2000N

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Used AIT	 CMT-SR2000N
AIT CMT-SR2000N Process: analysis

2006 Hitachi S-9260 CD-SEM

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Used 2006 Hitachi S-9260 CD-SEM
as-is Wafer Size: 200mm

2014 LTX Credence ASLx

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Used
- Full checkers - Vintage 2014 - Located in US - All as shown in the pictures

Rudolph FE-VIID Ellipsometer

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Used Rudolph FE-VIID Ellipsometer

Hewlett Packard 4194A Impedance Gain-Phase Analyzer

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Refurbished Hewlett Packard  4194A Impedance Gain-Phase Analyzer
Hewlett Packard 4194A Impedance Gain-Phase Analyzer Fully refurbished and calibrated See PDF be...

Zeiss Axiotron

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Used Zeiss Axiotron
Zeiss Axiotron Microscope 200 mm Wafer Configuration 10X Eyepieces 5X, 10X, 20X, 50X, 100X Obj...

Waferworx 53-450000-001

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Used Waferworx 53-450000-001
Waferworx 53-450000-001 3D Inspection 200mm and has Olympus Mdl MX80-F Microscope WAFER SIZE: 200mm

KLA TENCOR PROMETRIX AIT II

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Used KLA TENCOR PROMETRIX AIT II
KLA TENCOR PROMETRIX AIT II Metrology WAFER SIZE: 200MM

Hitachi

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Used Hitachi

2001 Hitachi WA200

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Used 2001 Hitachi WA200
Hitachi WA200 FAB SMIFF interface Wide area scanning probe microscope WAFER SIZE: 8"

KLA-Tencor Spectra-Shape 8660

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Used KLA-Tencor Spectra-Shape 8660
KLA-Tencor Spectra-Shape 8660 Semiconductor Fabrication Metrology Equipment CD Measurement System WAFER S...