cybeq

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Used cybeq

Hirata G450 Sorter 3 Port

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Used Hirata G450 Sorter  3 Port
Still installed in Nano Research Laboratory Hirata Equipment Front End Module is located in front...

Neslab CFT-150 Programmable Chiller, PD2 PUMP, 208-230VAC 1/3 HP R-22

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Used Neslab CFT-150 Programmable Chiller, PD2 PUMP, 208-230VAC 1/3 HP R-22
NESLAB CFT-150NESLAB CFT-150 PD-2 PUMP, 208 VAC, SINGLE PHASE 1/3 HP, R-22 POWERS UP, BUT IS NOT ...

Purex iQ2000 fume extraction unit

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Used Purex iQ2000 fume extraction unit
Two msystems available not including Filters

ASM FET cluster

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Used ASM FET cluster
ASM FET cluster

RIGAKU 3630 Xray Fluorescence Wafer/Disk Analyzer

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Used RIGAKU 3630 Xray Fluorescence Wafer/Disk Analyzer
Xray Fluorescence Wafer/Disk Analyzer, Missing: Xray Tube, PR Gas meter/valve assembly and perhap...

SDI SPV-300 Surface Photo Voltage Tester

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Used SDI SPV-300 Surface Photo Voltage Tester
Surface Photo Voltage Tester for up to 300mm Wafers

SDI SPV Station 1010 Surface Photo Voltage Tester

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Used SDI SPV Station 1010 Surface Photo Voltage Tester
Surface Photo Voltage Tester

SAGAX Isoscope 125 Film Thickness Monitor

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Used SAGAX Isoscope 125 Film Thickness Monitor
Film Thickness Monitor

GCA/TROPEL 9000 Surface Flatness Analyzer

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Used GCA/TROPEL 9000 Surface Flatness Analyzer
GCA/TROPEL 9000 Surface Flatness Analyzer Serial Number 202579 Fringe Sensitivity Range: 0.5 to 1...

IRVINE OPTICAL UltraSpec III Wafer Inspection Station

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Used IRVINE OPTICAL UltraSpec III Wafer Inspection Station
Wafer Inspection Station with Nikon Optiphot Optics

IONIC SYSTEMS Stressgauge II Wafer Stress Measurement

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Used IONIC SYSTEMS Stressgauge II Wafer Stress Measurement
Wafer Stress Measurement Tool,150mm Wafers