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2006 ASM DISPENSING SYSTEM; MODEL: DS89B
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2006 ASM EAGLE 60 WIRE BOND SYSTEM
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2006 ASM AD8930U DIE ATTACHMENT MACHINE
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NIKON NSR 2005 i8A Stepper
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Keithley S425
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Keithley, S425, Kerf Test, Keithley standard matrix kerf tester Tool ID: K255
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2007 Akrion Goldfinger Velocity 4
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Single wafer cleaning system 12" Vintage 2007 Defectivity Improvement The Velocity™single waf...
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2007 SONIX Quantum 350
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SONIX, Quantum 350, analysis, reliability, investigation Tool ID: CSM400
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2000 AMAT Ultima Centura
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2 chms. Wafer Size 200 mm Fab Section Thin Film Asset Description CENTURA DCVD Software Versi...
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Dionex Ion Chromatography System AS40, LC25, IC20 Lab
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This was removed from a university lab where it was surplus to requirements. The system has been...
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2000 AMAT Centura
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Metal Etch. No loadports included. Tool Status Running Wafers Wafer Size 200 mm Fab Section Et...
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2003 TEL P12XL
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TEL, P12XL, 300mm Tool Status Connected Wafer Size 300 mm Fab Section Test Asset Description ...
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2006 TEL CR385PH
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TEL, CR385PH, Tool ID: HTTD067004
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