FEI NanoLab 1200 AT DualBeam FIB-SEM

FEI NanoLab 1200 AT DualBeam FIB-SEM
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Description
- IXL120 Pump
- (2) X-Max Detectors, 80 mm HASKRIS Chiller
- Oxford INCA Integration Kit
- Integrated plasma cleaner
- Elstar Electron column
- TLD In-Lens detector
- Modes: SE, BSE
- Tomahawk ion column
- ICE Ion detector
- Eucentric stage, 300 mm
- Power line conditioner
- High-throughput wafer carrier Kit, (200 mm - 300 mm)
- Carbon deposition precursor
- S2 Compliant, 60 Hz
- High-frequency EMI Cancellation system (SC26)
- High-resolution optical microscope
- IFAST Pro
- IFAST Semiconductor wafer navigation
- INCA Energy 250
- Insulator-enhanced etch precursor
- MultiChem Gas delivery system
- Tungsten deposition precursor
- (2) 16:10 LCD Monitors, 24"
- Manual load / unload
- UI Table
- Workstation
- Joystick
- PC
- Operating system: Windows XP Manuals
- Does not include EFEM
Specifications
Manufacturer | FEI NanoLab |
Model | 1200 AT DualBeam FIB-SEM |
Condition | Used |
Stock Number | BM5233 |