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HMI eP4 320
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HMI, eP4 320, 300mm, ebeam Inspection In the Fab. Cold Idle Tool ID: SEI24000
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HITACHI CG4100
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HITACHI CG4100, 300mm Tool ID: KA41
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1990 KLA-Tencor P-1 Profiler
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- Model: P-1 - Long Scan Surface Profilometer - Wafer Size: 8"/200mm Note: this tool won’t boot
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1999 Leica IN3000
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Wafer Sizes: 8"/200mm Wafer defect inspection The Leica INS 3000 is the new defect review and in...
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CMI XRX-X4 X-Ray System
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System is Being Sold As-Is / Where-Is. Missing Computer & Software.
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KLA-TENCOR Surfscan 5500
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- Model 5500 Main System - Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, de...
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Hitachi S 4500 Scanning Electron Microscope (SEM)
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Veeco GXRS System XR X-Ray Thickness & Composition Measurement Tool
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Nanospec 8300 X Film Thickness Analyzer
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Zygo KMS 450i Mask Inspection tool
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Used
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ZEISS AIMS 193 Mask Qualification System w/Coherent LDU ESI 500Hz FT 193nm
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Used, looks complete, very clean
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Technical Instruments AMS 310 Mask Inspection tool
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Used, looks complete, very clean
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