NIKON NSR-SF200
NIKON NSR-SF200
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Description
As-is, Where-is
. Wafer size : 150mm
. Handedness : Inline left or right
configuration available
. Altitude : Varies by site
. Chamber type : Standard
. Chamber temperature set point :
. Variable numerical aperture : Max 0.63
. sPURE
. Resolution Enhancement Technology(RET)
-Options
. RET apertures iNA=
0.50, 0.38, 0.24, 0.19, 0.12, 0.38(Annual)
. Quick Reticle Change (QRC)
. Reticle Size : 6 inches
. Reticle Barcode Reader - Options
. Field Image Alignment system (FIA)
. Laser Step Alignment system (LSA)
. Phase Contrast FIA
. TTLFC2
. Pre-alignment 2
. Wafer stage : Air Bearing/Linear Motors
. Ceramic wafer holder
. Wafer loader
. Chip leveling included
. Multipoint Focus/Level
. Extended wafer carrier table - Options
. Pellicle particle Detector - Options
. Online
. Nikon SECS II GEM interface
. Gigaphoton KrF Excimer Laser Source
Specifications
Manufacturer | NIKON |
Model | NSR-SF200 |
Condition | Used |
Stock Number | BM3640 |