2010 JEOL 2100 Probe-Corrected Analytical Electron Microscope

Jeol 2100 Probe-Corrected Analytical Electron Microscope

- Applications: Aberration-corrected STEM imaging for atomic structures, Elemental mapping with EDS, EELS/EFTEM for elemental mapping and thickness measurements

- Acceleration Voltage: 100 and 200 kV

- Filament: Zirconated Tungsten (100) thermal field emission tip

- Vacuum: Gun ~ 1.0 x 10-9 torr, Column ~1.0 x 10-7 torr

- Resolution : CTEM 0.10 nm lattice / point to point, STEM 0.10 nm Cs-Corrected HAADF

- XEDS System: horizontal Ultra thin Window Si-Li X-ray detector capable of detecting elements with Z>5, EDAX r-TEM Detector with EDAX acquisition software

- EELS System: Gatan #863 Tridiem Imaging Filter (GIF) for electron energy loss spectroscopy and imaging.

- Image Acquisition & Analysis System:Gatan Ultrascan 1000 CCD TV camera (Post GIF)

- Other accessories: Free lens control, fully independent control of all lenses. TEMCon PC control software

2010 Vintage