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Rudolph NSX-105 Inspection Tool
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RUDOLPH NSX-95 Inspection Tool
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Veeco Wyko NT3300 Optical Profilometer
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KLA- Tencor Alpha Step IQ
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KLA- Tencor FLX-2320
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KLA-Tencor Prometrix RS55/tc Four Point Probe Resistivity Mapping System
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Nanometrics/ Bio-Rad/ Accent QS 2200A
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Nanometrics/Bio-Rad/Accent QS 2200A Type: FTIR Measurement System Equipment Configuration: - Fu...
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KLA- Tencor Prometrix UV-1050 Thin Film Measurement System
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4D Technology AccuFiz Fizeau Laser Interferometer
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AITCO CMT SR2000N 4 Pt Probe
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KLA/ MicroSense UMA-C200-STR Thin Film Stress Measurement System
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Hitachi S 3000 N
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SEM - Variable Pressure (Low Vacuum) - 6" Stage - Windows XP Operating System - HP DC 7600 -...
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