1995 KLA-TENCOR Opti-2600 Thickness Measurement WAFER SIZE: 8

2005 RUDOLPH AXI_S Inspection Defect Inspecion(Bump) WAFER SIZE: 12

1 HMI eScan400 2009 Metrology Inspection Defect Inspection

1999 KLA-TENCOR UV1080 WAFER SIZE: 200mm

attached is the spec sheet below. Please download it for info on these MM60 Microscopes.

5"

KLA-TENCOR KLA2131 Wafer size: 200mm Process: measurement

RUDOLPH WV320 Wafer size: 300mm Process: measurement

Inspection System. Status: In Storage 8"

Philips Model PQ Ruby PZ2500 Ellipsometer Ellipsometer system

FLX-2908 Setup for 200mm Wafers Comes with Neslab CFT-25 Chiller, PC, Keyboard, Monitorand Printe...

Suitable for parts harvesting only, Sold As Is Included 2 Objectives ( one front glass damage)