Metrology for sale at Tara Semiconductor Technology

Used Semiconductor Diagnostics SDI 210 210E-SPV, FAaST, Wafer Measurement

Used, looks complete, very clean

Used Scientific Computing International SCI FilmTek 4000-A Multiple Layer Thickness Measurement Tool

Used, looks complete, very clean

Used Rudolph FE-3 Focus Ellipsometer, 4" 6" 8" capable

Used, looks complete, very clean

Used PACIFIC WESTERN SYSTEMS (PWS) P5MS Wafer Prober, tester, power supply

Used, missing power supplies

Used PACIFIC WESTERN SYSTEMS (PWS) P5MS Wafer Prober, tester, power supply

Used, looks complete, very clean 6 INCH WAFER

Used Modo LS-200F-10 UV Light Source

Used, looks complete, very clean

Used KLA Tencor FLX-2908 Thin Film Stress Measurement System 230v 15A 1Ph 50Hz

Parts

Used Jandel RM 3000 Four Point Probe

Used, looks complete, very clean

Used Filmtek 4000-A Multiple Layer Thickness Measurement Tool, w/ LS-450 pulsed power supply, illuminator lamp mod# LS-1.

used 8 inch wafer

Used AXIC 1000 XRF, Metal Thickness measurement tool

Used, looks complete, very clean wafer size (inch): 4, 6, 8

Used Angstrom SE200BM Spectroscopic Ellipsometer w/ ASTBench TFProbe Spectrometer

Used

Used Angstrom Sun Technologies Transmission

Spectroscopic Ellipsometer Solar Cell Used, looks complete, very clean