HMI, eP4 320, 300mm, ebeam Inspection In the Fab. Cold Idle Tool ID: SEI24000

HITACHI CG4100, 300mm Tool ID: KA41

- Model: P-1 - Long Scan Surface Profilometer - Wafer Size: 8"/200mm Note: this tool won’t boot

Wafer Sizes: 8"/200mm Wafer defect inspection The Leica INS 3000 is the new defect review and in...

System is Being Sold As-Is / Where-Is. Missing Computer & Software.

- Model 5500 Main System - Can handle from 2" up to 8"/200mm wafers - Submicron sensitivity, de...

Used

Used, looks complete, very clean

Used, looks complete, very clean