Hitachi S-3000N SEM

Hitachi S-3000N scanning electron microscope is a PC controlled variable pressure SEM with the ability to switch between the high vacuum and variable pressure modes. It has a high density frame memory, and an advanced image capture and archiving system. Four quadrant solid state backscatter allows imaging in the compositional, 3D and topographic modes by manipulating from each segment of the detector.

System specifications

• 0.3 - 30kV acceleration voltage range
• 5 nm resolution at 25kV in variable pressure mode
• 150mm diameter maximum specimen size
• Dual-bias for low voltage signal noise
• Backscatter mode