Bio-Rad QS-1200 FT-IR Spectrometer

BIORAD QS-1200 Automated FT-IR Spectrometer

Non-Destructive Measurement of Epitaxial Silicon Films

PIKE TECHNOLOGIES MAP300 Automatic Scanning Stage

Manual Loading for up to 300mm Wafers

320 Test Points, 5mm Minimum Edge Exclusion & 3D Wafer Mapping

FTS-175 Optical Bench

Dynamically Tuned Beam Splitter

NKBr Beam Splitter

Dual Frequency IR Source

Upgraded HeNe Laser

System Control PC with Windows XP, 320G HD & 1G RAM

Win-IR Pro (Rev. 2.51) Application Software

QS-500 Epi (Rev. 1.31) Application Software

Microsoft Access Database Application

System Software, Applications Software & Site Preparation Manuals Included

Refurbished & Fully Functional

Wafer Size Range   Minimum 75 mm  Maximum 200 mm

Wafer Mapping YES

Scanning Stage YES

Controller Type PC Controller Type

Accessories Pike Technology MappIR Programmable Stage

Condition Excellent

Refurbished YES

Power Requirements 120 V   1 Phase