FEI QUANTA 200 3D DualBeam FIB
FEI QUANTA 200 3D DualBeam FIB
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Description
The FEI Quanta 200 3D Dual Beam SEM is equipped with a Ga Ion Source.
Capable of surface imaging at ~ 1nm resolution.
This instrument is a cutting-edge system capable of imaging and micro machining.
The instrument is capable of 1.2nm resolution at 30kV with the SE Detector.
FIB resolution is 5-7nm.
Ga Ion source has an acceleration voltage of 2kV to 30kV, and the ESEM resolution is 1.5nm.
Maximum Sample Dimensions
Maximum dimensions 150 x 100 x 25 mm will allow full stage movements
The operators manual is available to download below.
Specifications
Manufacturer | FEI |
Model | QUANTA 200 3D DualBeam |
Condition | Refurbished |
Stock Number | BM1251 |